NanoScan High Dynamic Range Beam Profiler - NanoScan scan heads are available to measure CW and pulsed beams across the entire spectral range from UV to far infrared.
Multiple Beam Analysis Software In addition to the hardware, the NanoScan has an integrated software package for the Microsoft Windows Platform, which can measure from one to 16 beams in the NanoScan aperture, all with sub-micron precision.
The silicon and germanium NanoScan systems include the 200mW power meter as a standard feature.
The NanoScan is available with silicon, germanium and pyroelectric detectors to cover the light spectrum from UV to far infrared beyond 100μm.
Features:

• Sub-micron precision for position and beam size
• Single and multiple beam analysis standard in one software package
• Software controllable scan speed (update rate)
• Peak-connect algorithm for pulsed beam measurement
• PCI interface and digital head control
• Laser beam XY position measurement uncertainty better than 300nm
• Beam size measurement precision to better than 0.5%